Testing Sequence Dependent Defects

By Narendra Devta-Prasanna

With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc. This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3838312198
• ISBN13: 9783838312194
• Release Date: September 2009
• Publisher: LAP Lambert Academic Publishing
• Length: 116 Pages
• Weight: 0.40 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"