Testing Semiconductor Memories: Theory and Practice

By A.J. Van De Goor

Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these... This description may be from another edition of this product.

• Format: Hardcover
• ISBN: 9080427616
• ISBN13: 9789080427617
• Release Date: January 1998
• Publisher: A.J. van de Goor
• Weight: 2.42 lbs.