Test Generation of CrossTalk Delay Faults in VLSI Circuits

By S. Jayanthy and M.C. Bhuvaneswari

Book Overview

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 9811347840
• ISBN13: 9789811347849
• Release Date: December 2018
• Publisher: Springer
• Length: 156 Pages
• Weight: 0.54 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"