X-ray Diffraction of Functional Materials

By: Walter Cornelius, Thomas

Demand for advanced X-ray scattering techniques has increased tremendously in recent years with the development of new functional materials. These characterizations have a huge impact on evaluating the microstructure and structure-property relation in functional materials. Thanks to its non-destructive character and adaptability to various environments, the X-ray is a powerful tool, being irreplaceable for novel in situ and operando studies. This book is dedicated to the latest advances in X-ray diffraction using both synchrotron radiation as well as laboratory sources for analyzing the microstructure and morphology in a broad range (organic, inorganic, hybrid, etc.) of functional materials.

• Format: Hardcover
• Language: English
• ISBN: 3036533656
• ISBN13: 9783036533650
• Release Date: March 2022
• Publisher: Mdpi AG
• Length: 188 Pages
• Weight: 1.34 lbs.
• Dimensions: 0.6" x 6.7" x 9.6"