Transmission Electron Microscopy and Diffractometry of Materials

By James Howe and Brent Fultz

Book Overview

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 3540437649
• ISBN13: 9783540437642
• Release Date: March 2005
• Publisher: Springer
• Length: 748 Pages
• Weight: 2.70 lbs.
• Dimensions: 9.0" x 1.3" x 6.3"