Proceedings of the Ninth Asian Test Symposium (Ats 2000)

By Asian Test Symposium

These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.

• Format: Paperback
• Language: English
• ISBN: 0769508871
• ISBN13: 9780769508870
• Release Date: January 2000
• Publisher: IEEE
• Weight: 2.50 lbs.
• Dimensions: 10.3" x 1.0" x 8.3"