Static Crosstalk-Noise Analysis: For Deep Sub-Micron Digital Designs

by Kurt Keutzer, Pinhong Chen, Desmond A Kirkpatrick, et al.

Book Overview

As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1402080913
• ISBN13: 9781402080913
• Release Date: June 2004
• Publisher: Springer
• Length: 113 Pages
• Weight: 0.81 lbs.
• Dimensions: 0.2" x 6.4" x 9.6"