Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

by Adam S. Foster and Werner A. Hofer

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides...

• Format: Paperback
• Language: English
• ISBN: 1441923063
• ISBN13: 9781441923066
• Release Date: November 2010
• Publisher: Springer
• Length: 282 Pages
• Weight: 0.92 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"