Sem of Plastics Failure: Rem Von Kunststoffscheaden

By Helmut Schaper, Hermann Klingele, Lothar Engel, et al.

Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations.

• Format: Hardcover
• Language: English
• ISBN: 1569905029
• ISBN13: 9781569905029
• Release Date: September 2010
• Publisher: Hanser Publications
• Length: 262 Pages
• Weight: 2.00 lbs.
• Dimensions: 0.6" x 7.9" x 10.7"