Reliability of Gallium Arsenide Mmics (Design and Measurement in Electronic Engineering)

By Aris Christou

Book Overview

A team of internationally renowned experts contribute articles which emphasize the reliability and quality issues inherent in all phases of systems design. Coverage includes fundamental failure modes of each of the device building blocks, packaged MMIC modules, current practical aspects of reliability testing and much more.

• Format: Hardcover
• Language: English
• ISBN: 0471934909
• ISBN13: 9780471934905
• Release Date: January 2012
• Publisher: Wiley
• Length: 478 Pages