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Parametric Reliability of Space-Based Field Pro...
Edition Details
Format:Paperback
Language:English
ISBN:1288311508
Format: Paperback
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Parametric Reliability of Space-Based Field Pro...
Edition Description
The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability...
Edition Details
Format:Hardcover
Language:English
ISBN:1025119622
Format: Hardcover
Condition:
$
29.95
Parametric Reliability of Space-Based Field Pro...
Edition Description
The high cost of failure for microelectronic devices operating in the space environment has led to a need for an accurate characterization of a device's reliability prior to being deployed. In addition, significant cost savings can be achieved by determining this reliability...
Edition Details
Format:Paperback
Language:English
ISBN:1025122437
Format: Paperback
Condition:
$
18.24
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