Monte Carlo Modeling for Electron Microscopy and Microanalysis

by David C. Joy

This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on...

• Format: Hardcover
• Language: English
• ISBN: 0195088743
• ISBN13: 9780195088748
• Release Date: April 1995
• Publisher: Oxford University Press, USA
• Length: 224 Pages
• Weight: 1.00 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"