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Long-Term Reliability of Nanometer VLSI Systems...
Edition Description
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss...
Edition Details
Format:Hardcover
Language:English
ISBN:3030261719
Format: Hardcover
Condition:
$
169.99
Long-Term Reliability of Nanometer VLSI Systems...
Edition Description
This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss...
Edition Details
Format:Paperback
Language:English
ISBN:3030261743
Format: Paperback
Condition:
$
169.99
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