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Introduction to Focused Ion Beam Nanometrology
By David C. Cox
Edition Description
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Edition Details
Format:Paperback
Language:English
ISBN:1681740206
Format: Paperback
Condition:
$
99.95
Introduction to Focused Ion Beam Nanometrology
By David C. Cox
Edition Description
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Edition Details
Format:Hardcover
Language:English
ISBN:1643278460
Format: Hardcover
Condition:
$
120.00
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