Introduction to Focused Ion Beam Nanometrology

By David C. Cox

Book Overview

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

• Format: Paperback
• Language: English
• ISBN: 1681740206
• ISBN13: 9781681740201
• Release Date: October 2015
• Publisher: Morgan & Claypool
• Length: 104 Pages
• Weight: 0.36 lbs.
• Dimensions: 0.2" x 7.0" x 10.0"