Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

By Dong Zhili

Book Overview

The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.

• Format: Paperback
• Language: English
• ISBN: 1032246804
• ISBN13: 9781032246802
• Release Date: November 2025
• Publisher: CRC Press
• Length: 272 Pages
• Weight: 0.90 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"