From Scientific Instrument to Industrial Machine: Coping with Architectural Stress in Embedded Systems

by Richard Doornbos

Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific...

• Format: Paperback
• Language: English
• ISBN: 9400741464
• ISBN13: 9789400741461
• Release Date: April 2012
• Publisher: Springer
• Length: 112 Pages
• Weight: 0.41 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"