Next Generation Halt and Hass: Robust Design of Electronics and Systems

by Kirk Gray

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS

A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics...

• Format: Hardcover
• Language: English
• ISBN: 1118700236
• ISBN13: 9781118700235
• Release Date: May 2016
• Publisher: Wiley
• Length: 296 Pages
• Weight: 1.15 lbs.
• Dimensions: 0.8" x 5.9" x 9.1"