Electron Microscopy of Thin Crystals

By Peter B. Hirsch and et al. Hirsch, Howie, Nicholson

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• Format: Hardcover
• Language: English
• ISBN: 0882753762
• ISBN13: 9780882753768
• Release Date: January 1993
• Publisher: Krieger Publishing Company
• Length: 563 Pages
• Weight: 2.72 lbs.

Customer Reviews

The classic

This book is old -- written in 1967, revised in 1977. Time has marched on.That said, this is still a valuable reference. It covers, in great depth, the theory of TEM, with chapters devoted to most subjects.The chapter and appendix on sample preparation are invaluable!This book will be somewhat superceeded when Marc de Graef's text is published (probably in Summer 2002 -- I took de Graef's course at Carnegie Mellon Univ., it was great!), but this book will still be an important reference, and an important historical signpost, in the field of TEM.