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Electromigration and Electronic Device Degradation 0471584894 Book Cover

Electromigration and Electronic Device Degradation

Edition Description

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current...

Edition Details
Format:Hardcover
Language:English
ISBN:0471584894
Format: Hardcover
Condition:
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