Electromigration and Electronic Device Degradation

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0471584894
• ISBN13: 9780471584896
• Release Date: December 1993
• Publisher: Wiley-Interscience
• Length: 343 Pages
• Weight: 1.51 lbs.
• Dimensions: 0.9" x 6.4" x 9.6"