Electromigration and Electronic Device Degradation

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.

• Format: Hardcover
• Language: English
• ISBN: 0471584894
• ISBN13: 9780471584896
• Release Date: December 1993
• Publisher: Wiley-Interscience
• Length: 343 Pages
• Weight: 1.51 lbs.
• Dimensions: 0.9" x 6.4" x 9.6"