Aftermath: World Trade Center Archive

by Joel Meyerowitz

After the destruction of the World Trade Center in New York on September 11th 2001, the world-renowned photographer Joel Meyerowitz felt compelled to visit the site. In his own words, he was 'overcome... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0714846554
• ISBN13: 9780714846552
• Release Date: August 2006
• Publisher: Phaidon Press
• Length: 350 Pages
• Weight: 8.27 lbs.
• Dimensions: 1.5" x 11.3" x 15.8"