Progress in Nanoscale Characterization and Manipulation

by Wang

Book Overview

Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research

Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy

Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques

• Format: Paperback
• Language: English
• ISBN: 9811344205
• ISBN13: 9789811344206
• Release Date: January 2019
• Publisher: Springer
• Length: 508 Pages
• Weight: 1.58 lbs.
• Dimensions: 1.0" x 6.1" x 9.2"