Applied Scanning Probe Methods I

by Sumio Hosaka and Harald Fuchs

Book Overview

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies,...

• Format: Hardcover
• Language: English
• ISBN: 3540005277
• ISBN13: 9783540005278
• Release Date: January 2004
• Publisher: Springer
• Length: 476 Pages
• Weight: 1.92 lbs.
• Dimensions: 1.1" x 6.1" x 9.2"