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Yield and Variability Optimization of Integrated Circuits
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Yield and Variability Optimization of Integrate... 146135935X Book Cover

Yield and Variability Optimization of Integrate...

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Edition Description

Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing...

Edition Details
Format:Paperback
Language:English
ISBN:146135935X
Format: Paperback
Condition:
$
109.99
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