X-Ray Microscopy III: Proceedings of the Third International Conference, London, September 3-7, 1990

By Graeme R. Morrison Christopher J. Buckley Alan G. Michette

As an up-to-date overview of the rapidly advancing field of X-ray microscopy, this volume will be welcomed both by established researchers and by newcomers to the field.

• Format: Paperback
• Language: English
• ISBN: 3662138948
• ISBN13: 9783662138946
• Release Date: October 2013
• Publisher: Springer
• Length: 493 Pages
• Weight: 1.56 lbs.
• Dimensions: 1.0" x 6.1" x 9.2"