X-Ray Microscopy: Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999

By Werner Meyer-Ilse

This volume is the status report of the international community of practitioners of x-ray microscopy. It contains the reviews and work presented at the 6th International Conference on X-Ray Microscopy... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1563969262
• ISBN13: 9781563969263
• Release Date: May 2000
• Publisher: American Institute of Physics
• Length: 748 Pages
• Weight: 2.83 lbs.
• Dimensions: 1.8" x 6.7" x 9.5"