X-Ray Diffraction: Structure, Principles and Applications (Materials Science and Technologies)

By Kaimin Shih

An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 1628085916
• ISBN13: 9781628085914
• Release Date: September 2013
• Publisher: Nova Science Pub Inc
• Length: 282 Pages
• Weight: 1.60 lbs.
• Dimensions: 9.8" x 0.8" x 6.8"