VLSI Test Symposium (VTS '98), 16th IEEE

By Institute of Electrical and Electronics Engineers

This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis;... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0818684364
• ISBN13: 9780818684364
• Release Date: May 1998
• Publisher: IEEE Computer Society
• Length: 500 Pages
• Weight: 2.60 lbs.
• Dimensions: 11.0" x 1.0" x 8.8"