VLSI Test Principles and Architectures: Design for Testability

By Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu

Book Overview

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Format: Hardcover
• Language: English
• ISBN: 0123705975
• ISBN13: 9780123705976
• Release Date: July 2006
• Publisher: Morgan Kaufmann Publishers
• Length: 808 Pages
• Weight: 3.35 lbs.
• Dimensions: 2.1" x 8.1" x 9.4"