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VLSI Implementation of Built in Self-Test
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VLSI Implementation of Built in Self-Test 6207807804 Book Cover

VLSI Implementation of Built in Self-Test

Edition Description

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is...

Edition Details
Format:Paperback
Language:English
ISBN:6207807804
Format: Paperback
Condition:
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