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VLSI Fault Modeling and Testing Techniques: (VLSI Design Automation Series)
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VLSI Fault Modeling and Testing Techniques 0893917818 Book Cover

VLSI Fault Modeling and Testing Techniques

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Edition Description

VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open...

Edition Details
Format:Hardcover
Language:English
ISBN:0893917818
Format: Hardcover
Condition:
$
80.00
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