Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits

By Martin Wirnshofer

Book Overview

1 Introduction.

2 Sources of Variation. 2.1 Process Variations. 2.2 Voltage Variations. 2.3 Temperature Variations. 2.4 Aging. 2.5 Summary.

3 Related Work. 3.1 Dynamic Voltage Scaling. 3.2 Adaptive Voltage Scaling.

4 Adaptive Voltage Scaling by In-situ Delay Monitoring. 4.1 Principle of Operation. 4.2 Overall AVS Control Loop.

5 Design of In-situ Delay Monitors. 5.1 Delay-element based Pre-Error Flip-Flop. 5.2 Duty-Cycle based Pre-Error Flip-Flops. 5.3 Comparison of In-situ Delay Monitors.

6 Modeling the AVS Control Loop. 6.1 Simulation Methodology. 6.2 Markov Model of the Pre-Error AVS System. 6.3 Stability of the Control Loop.

7 Evaluation of the Pre-Error AVS Approach. 7.1 Power Saving Potential and Reliability. 7.2 Application of Pre-Error AVS for an Image Processing Circuit.

8 Conclusion.

A Appendix. A.1 Mathematical Derivation: Path Delay under Local Variations. A.2 2-D DCT Transform.

References.

• Format: Paperback
• Language: English
• ISBN: 9401783675
• ISBN13: 9789401783675
• Release Date: March 2015
• Publisher: Springer
• Length: 83 Pages
• Weight: 0.32 lbs.
• Dimensions: 0.2" x 6.1" x 9.2"