Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

By Mahtab Niknahad

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

• Format: Paperback
• Language: English
• ISBN: 3731500388
• ISBN13: 9783731500384
• Release Date: July 2013
• Publisher: Karlsruher Institut Fur Technologie
• Length: 162 Pages
• Weight: 0.59 lbs.
• Dimensions: 0.3" x 6.7" x 9.6"