Trap Level Spectroscopy in Amorphous Semiconductors

By Victor V. Mikla

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

• Format: Hardcover
• Language: English
• ISBN: 012384715X
• ISBN13: 9780123847157
• Release Date: June 2010
• Publisher: Elsevier
• Length: 128 Pages
• Weight: 0.80 lbs.
• Dimensions: 9.0" x 0.5" x 6.0"