Transmission Electron Microscopy and Diffractometry of Materials

by James Howe and Brent Fultz

Book Overview

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book...

• Format: Paperback
• Language: English
• ISBN: 3642433154
• ISBN13: 9783642433153
• Release Date: November 2014
• Publisher: Springer
• Length: 764 Pages
• Weight: 2.38 lbs.
• Dimensions: 1.6" x 6.1" x 9.2"