Transistor-Level Defect-Tolerant Techniques for Reliable Design: at the Nanoscale

By Farhan Khan

In this book, detailed investigation of a recently proposed transistor-level defect-tolerant technique for nanoelectronics is performed. The investigated technique replaces each transistor by an N... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3846544337
• ISBN13: 9783846544334
• Release Date: March 2012
• Publisher: LAP Lambert Academic Publishing
• Length: 228 Pages
• Weight: 0.75 lbs.
• Dimensions: 0.5" x 6.0" x 9.0"