Thermal Testing of Integrated Circuits

by J. Altet and Antonio Rubio

Book Overview

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds of millions of devices. They work at extremely low voltages and switch at very high frequencies. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure...

• Format: Paperback
• Language: English
• ISBN: 144195287X
• ISBN13: 9781441952875
• Release Date: September 2011
• Publisher: Springer
• Length: 204 Pages
• Weight: 0.71 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"