Thermal-Aware Testing of Digital VLSI Circuits and Systems

By Santanu Chattopadhyay

Book Overview

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level

Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques

This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

• Format: Paperback
• Language: English
• ISBN: 0367607093
• ISBN13: 9780367607098
• Release Date: June 2020
• Publisher: CRC Press
• Length: 118 Pages
• Weight: 0.39 lbs.
• Dimensions: 0.3" x 5.4" x 8.4"