The Reliability of Strained Si Mosfets on Varied Technology Platforms

By Rimoon Agaiby

The reliability of strained Si devices on several technology platforms has been investigated, highlighting the advantages and disadvantages in each case. The devices had biaxial strain induced through... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3838363329
• ISBN13: 9783838363325
• Release Date: May 2010
• Publisher: LAP Lambert Academic Publishing
• Length: 176 Pages
• Weight: 0.59 lbs.
• Dimensions: 0.4" x 6.0" x 9.0"