The Physics of Moire Metrology

By Oded Kafri

This is a comprehensive introduction to Moire technology, the physics behind it and its applications to optics. It provides background information on the development of Moire methodology and compares moire analysis with conventional methods on wave properties (such as interferometry). The authors show that for every interferometric technique in metrology there is an analogous one in Moire technology, demonstrating that Moire analysis is a real alternative to interfermonetry and holography.

• Format: Hardcover
• Language: English
• ISBN: 0471509671
• ISBN13: 9780471509677
• Release Date: January 1990
• Publisher: Wiley-Interscience
• Length: 194 Pages
• Weight: 1.00 lbs.
• Dimensions: 9.3" x 0.9" x 6.3"