The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties

By John Wilfred Orton

This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves. Emphasizes the physics and theory underlying the experimental characterization of semicondutors**Deals with the measurement of minority lifetimes and diffusion length**Discusses electrical and optical methods***INCLUDED IN PHYSICS TODAY, SEPT 90***INCLUDED IN MRS BULLETIN, NOVEMBER 90***INCLUDED IN JRNL OF VACUUM SCI, DECEMBER 90***INCLUDED IN PHYSICS TODAY, FEBRUARY 91

• Format: Hardcover
• Language: English
• ISBN: 0125286252
• ISBN13: 9780125286251
• Release Date: November 1990
• Publisher: Academic Press
• Length: 291 Pages
• Weight: 1.30 lbs.
• Dimensions: 9.8" x 1.0" x 6.5"