The 10th International Conference on X-Ray Microscopy: Chicago, Illinios, USA, 15-20 August 2010

Would be of interest to researchers in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 0735409250
• ISBN13: 9780735409255
• Release Date: October 2011
• Publisher: American Institute of Physics
• Length: 473 Pages
• Weight: 2.35 lbs.
• Dimensions: 1.0" x 8.4" x 10.9"