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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
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Testing Static Random Access Memories: Defects,... 1402077521 Book Cover

Testing Static Random Access Memories: Defects,...

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Edition Description

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory...

Edition Details
Format:Hardcover
Language:English
ISBN:1402077521
Format: Hardcover
Condition:
$
109.99
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