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Testing and Failure Analysis: Proceedings of the 23rd International Symposium Held in Santa Clara, CA, 1997
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ISTFA 97: International Symposium for Testing &... 0871706199 Book Cover

ISTFA 97: International Symposium for Testing &...

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Edition Description

Proceedings of the October 1997 symposium, of interest to engineers involved in testing and failure analysis of semiconductor devices. Contains sections on testing and signature analysis, techniques, micro-electric-mechanical systems, discretes, packaging/E-beam, FIB/E- beam,...

Edition Details
Format:Hardcover
Language:English
ISBN:0871706199
Format: Hardcover
Condition:
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