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Testability Concepts for Digital ICs: The Macro Test Approach
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Testability Concepts for Digital ICS: The Macro... 1461360048 Book Cover

Testability Concepts for Digital ICS: The Macro...

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Edition Description

Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an...

Edition Details
Format:Paperback
Language:English
ISBN:1461360048
Format: Paperback
Condition:
$
169.99
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