Test Coverage Analysis

By Francisco Paez

This document provides a complete description of a method for analyzing test coverage at a structural and functional level of a printed circuit board during the production process. Regarding the... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 383837388X
• ISBN13: 9783838373881
• Release Date: June 2010
• Publisher: LAP Lambert Academic Publishing
• Length: 136 Pages
• Weight: 0.46 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"