Test and Reliability of SRAM Memories

by Renan Fonseca

This book considers the following problems in the domain of test and reliability of SRAM memories: optimizing test flow using stress conditions; statistical simulation for very low probabilities;... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3659124974
• ISBN13: 9783659124976
• Release Date: May 2012
• Publisher: LAP Lambert Academic Publishing
• Length: 140 Pages
• Weight: 0.47 lbs.
• Dimensions: 0.3" x 6.0" x 9.0"