Systematic Destruction of Electronic Parts for Aid in Electronic Failure Analysis

By: Administration (Nasa), National Aeronaut

Technical Report Decker, S. E. and Rolin, T. D. and McManus, P. D. Marshall Space Flight Center NASA/TM-2012-217462, M-1338 FAILURE ANALYSIS; ELECTROMECHANICS; ELECTRIC POTENTIAL; TRANSISTORS; AVIONICS; FAILURE MODES; OPERATIONAL AMPLIFIERS; NASA PROGRAMS; FLIGHT TESTS

• Format: Paperback
• Language: English
• ISBN: B08F6RC9BV
• ISBN13: 9798673051757
• Release Date: January 1
• Publisher: Independently Published
• Length: 48 Pages
• Weight: 0.30 lbs.
• Dimensions: 0.1" x 8.5" x 11.0"