Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

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Synthetic Polymeric Membranes: Characterization...

By C.Y. Feng, K.C. Khulbe, Takeshi Matsuura, et al.

Edition Description

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved...

Edition Details

Format:Hardcover

Language:English

ISBN:3540739939

Format: Hardcover

Condition:

109.99

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Synthetic Polymeric Membranes: Characterization...

By C.Y. Feng, K.C. Khulbe, Takeshi Matsuura, et al.

Edition Description

Edition Details

Format:Paperback

Language:English

ISBN:3642093272

Format: Paperback

Condition:

149.99

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All Formats & Editions

Synthetic Polymeric Membranes: Characterization...

Synthetic Polymeric Membranes: Characterization...

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